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Please use this identifier to cite or link to this item: http://dx.doi.org/10.25673/5644
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dc.contributor.authorYakimov, Evgeny
dc.contributor.authorGoldshtein, Alexander
dc.contributor.authorBulgakov, Valery
dc.contributor.authorShipilov, Sergey
dc.date.accessioned2018-09-24T18:24:07Z-
dc.date.available2018-09-24T18:24:07Z-
dc.identifier.urihttps://opendata.uni-halle.de//handle/1981185920/12455-
dc.identifier.urihttp://dx.doi.org/10.25673/5644-
dc.language.isoeng-
dc.publisherBibliothek, Hochschule Anhalt
dc.relation.ispartofTitel: Proceedings of the 2nd International Conference on Applied Innovations in IT, Volume Nr. 2
dc.relation.haspartTitel: Proceedings of the 2nd International Conference on Applied Innovations in IT, Volume Nr. 2
dc.subject.ddc004-
dc.titleData Processing at the Flaw Detector with Combined Multisector Eddy-Current Transducer
dcterms.typeHochschulschrift
dc.typeBook
dc.identifier.urnurn:nbn:de:gbv:kt1-357
local.openaccesstrue-
Appears in Collections:Elektrotechnik, Maschinenbau und Wirtschaftsingenieurwesen

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