Please use this identifier to cite or link to this item: http://dx.doi.org/10.25673/120477
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dc.contributor.authorHerklotz, Andreas-
dc.contributor.authorPetrie, Jonathan R.-
dc.contributor.authorWard, Thomas Z.-
dc.date.accessioned2025-09-02T06:40:56Z-
dc.date.available2025-09-02T06:40:56Z-
dc.date.issued2025-
dc.identifier.urihttps://opendata.uni-halle.de//handle/1981185920/122433-
dc.identifier.urihttp://dx.doi.org/10.25673/120477-
dc.description.abstractManipulating electronic orbital states in quantum materials provides a powerful means of controlling their physical properties and technological functionality. Here, we demonstrate that orbital populations in strongly correlated oxide thin films can be continuously and reversibly tuned through postsynthesis He ion implantation. Using LaNiO3 as a model system, we show that the orbital preference can be systematically adjusted from favoring in-plane dx2–y2 occupation toward out-of-plane dz2 states through precise control of ion fluence. Unlike conventional heteroepitaxial approaches that lock in orbital configurations during growth, this strain-doping technique enables continuous orbital tuning and the selective modification of specific film regions after device fabrication. We demonstrate the practical impact of this control by achieving a 7-fold enhancement in oxygen reduction reaction catalysis. This work establishes ion implantation as a powerful approach for orbital engineering that complements existing synthesis-based strategies while offering unique advantages for both basic research and device development.eng
dc.language.isoeng-
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/-
dc.subject.ddc530-
dc.titleBeyond epitaxy : ion implantation as a tool for orbital engineeringeng
dc.typeArticle-
local.versionTypepublishedVersion-
local.bibliographicCitation.journaltitleACS applied electronic materials-
local.bibliographicCitation.volume7-
local.bibliographicCitation.issue16-
local.bibliographicCitation.pagestart7580-
local.bibliographicCitation.pageend7584-
local.bibliographicCitation.publishernameACS Publications-
local.bibliographicCitation.publisherplaceWashington, DC-
local.bibliographicCitation.doi10.1021/acsaelm.5c00815-
local.openaccesstrue-
dc.identifier.ppn1935129546-
cbs.publication.displayform2025-
local.bibliographicCitation.year2025-
cbs.sru.importDate2025-09-02T06:40:34Z-
local.bibliographicCitationEnthalten in ACS applied electronic materials - Washington, DC : ACS Publications, 2019-
local.accessrights.dnbfree-
Appears in Collections:Open Access Publikationen der MLU

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