Please use this identifier to cite or link to this item: http://dx.doi.org/10.25673/120845
Title: Enhanced magnetic dichroism in dark-field UV photoemission electron microscopy
Author(s): Paleschke, MaximilianLook up in the Integrated Authority File of the German National Library
Huber, DavidLook up in the Integrated Authority File of the German National Library
Wührl, Friederike
Chiang, Cheng-TienLook up in the Integrated Authority File of the German National Library
Schumann, Frank O.
Henk, JürgenLook up in the Integrated Authority File of the German National Library
Widdra, Wolf
Issue Date: 2025
Type: Article
Language: English
Abstract: Photoemission electron microscopy (PEEM) has evolved into an indispensable tool for structural and magnetic characterization of surfaces at the nanometer scale. In strong contrast to synchrotron-radiation-based x-ray PEEM as a leading method for element-specific magnetic properties via magnetic circular dichroism (MCD), laboratory ultraviolet (UV) PEEM has seen limited application with much smaller dichroic effects for in-plane magnetization. Here, we introduce dark-field PEEM as an approach to enhance MCD contrast in threshold photoemission, enabling efficient MCD imaging with significantly enhanced contrast by an order of magnitude for Fe(001). This advancement paves the way for MCD imaging on femtosecond timescales using modern lasers. The experimental results will be quantitatively benchmarked against advanced relativistic photoemission calculations.
URI: https://opendata.uni-halle.de//handle/1981185920/122801
http://dx.doi.org/10.25673/120845
Open Access: Open access publication
License: (CC BY 4.0) Creative Commons Attribution 4.0(CC BY 4.0) Creative Commons Attribution 4.0
Journal Title: Physical review
Publisher: Inst.
Publisher Place: Woodbury, NY
Volume: 112
Original Publication: 10.1103/klc4-lk7g
Page Start: 054411
Page End: 1-054411-7
Appears in Collections:Open Access Publikationen der MLU

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