Microscopic characterization of Poly(Sulfur Nitride)

Abstract

The morphology of poly(sulfur nitride) (SNx) in bulk crystals and in thin films is investigated by grazing incidence wide-angle X-ray scattering (GI WAXS) and atomic force microscopy (AFM). SNx crystals are grown in S2N2 crystals by topochemical solid-state polymerization and thin SNx films are prepared by sublimation/repolymerization of SNx or by mechanical deformation of crystals onto silicon substrates. Details of the crystallographic orientation of two different thin films are observed by GI WAXS. PeakForce Tunneling (PF-TUNA) atomic force microscopy provides information on the electrical conductivity of SNx crystal together with its morphology in the nm range. The current–voltage (I–V) curves show ohmic behavior indicating the metallic nature of SNx.