Please use this identifier to cite or link to this item: http://dx.doi.org/10.25673/13899
Title: Enhancement of near-infrared emission from Ge(Si) quantum dots embedded in silicon microresonators
Author(s): Rutckaia, ViktoriiaLook up in the Integrated Authority File of the German National Library
Referee(s): Schilling, JörgLook up in the Integrated Authority File of the German National Library
Scheer, RolandLook up in the Integrated Authority File of the German National Library
Pertsch, ThomasLook up in the Integrated Authority File of the German National Library
Granting Institution: Martin-Luther-Universität Halle-Wittenberg
Issue Date: 2018
Extent: 1 Online-Ressource (131 Seiten)
Type: HochschulschriftLook up in the Integrated Authority File of the German National Library
Type: PhDThesis
Exam Date: 2018-07-11
Language: English
URN: urn:nbn:de:gbv:3:4-1981185920-140266
Abstract: CMOS-kompatible Lichtemissionsquellen werden intensiv für integrierte aktive Silizium-Photonikschaltungen untersucht. In dieser Arbeit wird die Lumineszenzanhebung und die Erhöhung der spontanen Emissionsrate der Ge(Si)-QP-Emission gekoppelt mit optischen Resonatoren auf Si-Basis experimentell untersucht. Dazu wurden Ge(Si) QP-Multilayer, die in einer dünnen Si-Platte auf einem SOI-Wafer aufgewachsen sind, mittels Elektronenstrahl-Lithographie und reaktivem Ionenätzen strukturiert. Drei Arten von optischen Resonatoren wurden in dieser Arbeit untersucht: Whispering Gallery-Mode-Resonatoren (WGM), photonische Kristalle (PhK) und Mie-Resonatoren. Die hergestellten Strukturen wurden durch stationäre und zeitaufgelöste Mikrophotolumineszenz untersucht. Die Untersuchung von Ge(Si)-QP zeigte, dass der wichtigste limitierende Faktor für die experimentelle Bestimmung der Purcell-Verstärkung die schnelle Auger Rekombination ist, die die strahlende Rekombination bei hohen Ladungsträgerkonzentrationen dominiert.
CMOS-compatible light emitters are intensely investigated for integrated active silicon photonic circuits. In this work, luminescence enhancement and the enhancement of spontaneous emission rate of Ge(Si) quantum dot (QD) emission coupled to Si-based optical resonators is experimentally investigated. For this, Ge(Si) QD multilayers, which were grown in a thin Si slab on an SOI wafer, were patterned by means of electron-beam lithography and reactive ion etching. Three types of optical resonators were considered: whispering gallery mode resonators, photonic crystal cavities, and Mie-resonators. Finite element modelling allowed designing nanostructure parameters that resulted in the presence of resonant modes in the QD luminescence spectral range. Fabricated structures were probed by steady-state and time-resolved micro-photoluminescence. Investigation of Ge(Si) QDs showed that the main limiting factor of the experimental determination of the Purcell enhancement is fast Auger recombination, which dominates the radiative recombination at high charge carrier concentrations.
URI: https://opendata.uni-halle.de//handle/1981185920/14026
http://dx.doi.org/10.25673/13899
Open Access: Open access publication
License: In CopyrightIn Copyright
Appears in Collections:Physik

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