Please use this identifier to cite or link to this item:
http://dx.doi.org/10.25673/118512
Title: | Intermittent in-situ high-resolution X-ray microscopy of 400-nm porous glass under uniaxial compression : study of pore changes and crack formation |
Author(s): | Schäfer, Sebastian![]() Willot, François Bale, Hrishikesh Norouzi Rad, Mansoureh Kelly, Stephen T. Enke, Dirk ![]() Martins de Souza e Silva, Juliana |
Issue Date: | 2025 |
Type: | Article |
Language: | English |
URI: | https://opendata.uni-halle.de//handle/1981185920/120470 http://dx.doi.org/10.25673/118512 |
Open Access: | ![]() |
License: | ![]() |
Journal Title: | Scripta materialia |
Publisher: | Elsevier Science |
Publisher Place: | Amsterdam [u.a.] |
Volume: | 255 |
Original Publication: | 10.1016/j.scriptamat.2024.116396 |
Page Start: | 1 |
Page End: | 5 |
Appears in Collections: | Open Access Publikationen der MLU |
Files in This Item:
File | Description | Size | Format | |
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1-s2.0-S1359646224004317-main.pdf | 6.26 MB | Adobe PDF | ![]() View/Open |